TOF-LEIS spectra of Ga/Si: Peak shape analysis

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 2007 Vol. 265; Iss. 2

TOF-LEIS spectra of Ga/Si: Peak shape analysis

M. Kolíbal, O. Tomanec, S. Průša, M. Plojhar, S.N. Markin, L. Dittrichová, J. Spousta, P. Bauer, T. Šikola
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Volume:
265
Year:
2007
Language:
english
Pages:
7
DOI:
10.1016/j.nimb.2007.09.038
File:
PDF, 936 KB
english, 2007
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