Depth profiling of carbon in silicon using the...

Depth profiling of carbon in silicon using the 12C(p, p′γ) reaction

K. Yasuda, R. Ishigami, M. Sasase, Y. Ito
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Volume:
266
Year:
2008
Language:
english
Pages:
5
DOI:
10.1016/j.nimb.2008.02.010
File:
PDF, 216 KB
english, 2008
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