Atomistic modelling of the interface of Si nanocrystal...

Atomistic modelling of the interface of Si nanocrystal structures in a-SiO2 before and after ion irradiation

Djurabekova Flyura, Backman Marie, Nordlund Kai
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Volume:
266
Year:
2008
Language:
english
Pages:
4
DOI:
10.1016/j.nimb.2008.03.099
File:
PDF, 502 KB
english, 2008
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