Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
2010 Vol. 268; Iss. 3-4
Soft X-ray spectroscopy of oxide-embedded and functionalized silicon nanocrystals
Joel A. Kelly, Eric J. Henderson, Colin M. Hessel, Ronald G. Cavell, Jonathan G.C. VeinotVolume:
268
Year:
2010
Language:
english
Pages:
5
DOI:
10.1016/j.nimb.2009.09.040
File:
PDF, 452 KB
english, 2010