Combined Rietveld refinement of Zn2SiO4:Mn2+ using X-ray...

Combined Rietveld refinement of Zn2SiO4:Mn2+ using X-ray and neutron powder diffraction data

Yong-Il Kim, Won Bin Im, Kwon-Sang Ryu, Ki-Bok Kim, Yun-Hee Lee, Jeong Soon Lee
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Volume:
268
Year:
2010
Language:
english
Pages:
6
DOI:
10.1016/j.nimb.2009.09.056
File:
PDF, 517 KB
english, 2010
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