The generalized Radon transform: Sampling, accuracy and...

Pattern Recognition 2005 Vol. 38; Iss. 12

The generalized Radon transform: Sampling, accuracy and memory considerations

Cris L. Luengo Hendriks, Michael van Ginkel, Piet W. Verbeek, Lucas J. van Vliet
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Volume:
38
Year:
2005
Language:
english
Pages:
12
DOI:
10.1016/j.patcog.2005.04.018
File:
PDF, 651 KB
english, 2005
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