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Motif-based defect detection for patterned fabric
Henry Y.T. Ngan, Grantham K.H. Pang, Nelson H.C. YungVolume:
41
Year:
2008
Language:
english
Pages:
17
DOI:
10.1016/j.patcog.2007.11.014
File:
PDF, 1.42 MB
english, 2008