ChemInform Abstract: Atomic Force Microscope (AFM) Based...

ChemInform 1998 Vol. 29; Iss. 12

ChemInform Abstract: Atomic Force Microscope (AFM) Based Kelvin Probe Measurements: Application to an Electrochemical Reaction.

M. BOEHMISCH, F. BURMEISTER, A. RETTENBERGER, J. ZIMMERMANN, J. BONEBERG, P. LEIDERER
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Volume:
29
Year:
1998
Pages:
1
DOI:
10.1002/chin.199812012
File:
PDF, 29 KB
1998
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