Quantifying resistivity using scanning impedance imaging

Sensors and Actuators A: Physical 2007 Vol. 137; Iss. 2

Quantifying resistivity using scanning impedance imaging

Brian G. Buss, Daniel N. Evans, Hongze Liu, Tao Shang, Travis E. Oliphant, Stephen M. Schultz, Aaron R. Hawkins
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Volume:
137
Year:
2007
Language:
english
Pages:
7
DOI:
10.1016/j.sna.2007.03.005
File:
PDF, 515 KB
english, 2007
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