Defect characterisation based on pulsed eddy current...

Defect characterisation based on pulsed eddy current imaging technique

Yunze He, Feilu Luo, Mengchun Pan
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Volume:
164
Year:
2010
Language:
english
Pages:
7
DOI:
10.1016/j.sna.2010.09.001
File:
PDF, 1.59 MB
english, 2010
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