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Response to hydrogen of a metal/AlN/Si thin film structure: Effects of composition and structure of a combination Pd–Cr gate
Linfeng Zhang, Erik F. McCullen, Md H. Rahman, Jagdish S. Thakur, Lajos Rimai, Ron J. Baird, Ratna Naik, Golam Newaz, Gregory W. Auner, K.Y. Simon NgVolume:
113
Year:
2006
Language:
english
Pages:
9
DOI:
10.1016/j.snb.2005.03.115
File:
PDF, 480 KB
english, 2006