Investigation of scaling of InSb MOSFETs through...

Investigation of scaling of InSb MOSFETs through drift–diffusion simulation

Edin Sijerčić, Branimir Pejčinović
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Volume:
50
Year:
2006
Language:
english
Pages:
6
DOI:
10.1016/j.sse.2006.07.008
File:
PDF, 165 KB
english, 2006
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