Hot-carrier stress induced degradation of SLS ELA polysilicon TFTs – Effects of gate width variation and device orientation
Giannis P. Kontogiannopoulos, Filippos V. Farmakis, Dimitrios N. Kouvatsos, George J. Papaioannou, Apostolos T. VoutsasVolume:
52
Year:
2008
Language:
english
Pages:
6
DOI:
10.1016/j.sse.2007.10.008
File:
PDF, 303 KB
english, 2008