Microscopic modeling of hole inversion layer mobility in...

Microscopic modeling of hole inversion layer mobility in unstrained and uniaxially stressed Si on arbitrarily oriented substrates

A.T. Pham, C. Jungemann, B. Meinerzhagen
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Volume:
52
Year:
2008
Language:
english
Pages:
6
DOI:
10.1016/j.sse.2008.04.006
File:
PDF, 429 KB
english, 2008
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