Band gap engineered resistor for mitigating linear energy transfer sensitivities in scaled submiron CMOS technology SRAM cells
Esau Kanyogoro, Martin Peckerar, Harold Hughes, Mike LiuVolume:
52
Year:
2008
Language:
english
Pages:
8
DOI:
10.1016/j.sse.2008.06.005
File:
PDF, 769 KB
english, 2008