A compact model of fringing field induced parasitic...

Solid-State Electronics 2009 Vol. 53; Iss. 9

A compact model of fringing field induced parasitic capacitance for deep sub-micrometer MOSFETs

Xi Liu, Xiaoshi Jin, Jong-Ho Lee
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Volume:
53
Year:
2009
Language:
english
Pages:
5
DOI:
10.1016/j.sse.2009.04.010
File:
PDF, 652 KB
english, 2009
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