Substrate impact on threshold voltage and subthreshold slope of sub-32 nm ultra thin SOI MOSFETs with thin buried oxide and undoped channel
S. Burignat, D. Flandre, M.K. Md Arshad, V. Kilchytska, F. Andrieu, O. Faynot, J.-P. RaskinVolume:
54
Year:
2010
Language:
english
Pages:
7
DOI:
10.1016/j.sse.2009.12.021
File:
PDF, 981 KB
english, 2010