Impact of drain bias stress on forward/reverse mode...

Impact of drain bias stress on forward/reverse mode operation of amorphous ZIO TFTs

Aritra Dey, David R. Allee, Lawrence T. Clark
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Volume:
62
Year:
2011
Language:
english
Pages:
6
DOI:
10.1016/j.sse.2011.04.011
File:
PDF, 688 KB
english, 2011
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