Direct parameter-extraction method for MOSFET noise model...

Solid-State Electronics 2011 Vol. 63; Iss. 1

Direct parameter-extraction method for MOSFET noise model from microwave noise figure measurement

Jianjun Gao
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Volume:
63
Year:
2011
Language:
english
Pages:
7
DOI:
10.1016/j.sse.2011.05.011
File:
PDF, 758 KB
english, 2011
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