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Microstructural effects on the electrical properties of grain boundary Fe-doped LSGM
E. Gomes, F.M.B. Marques, F.M. FigueiredoVolume:
179
Year:
2008
Language:
english
Pages:
4
DOI:
10.1016/j.ssi.2008.01.073
File:
PDF, 246 KB
english, 2008