Curvature radius analysis for scanning probe microscopy

Surface Science 2005 Vol. 585; Iss. 1-2

Curvature radius analysis for scanning probe microscopy

Pierre-Emmanuel Mazeran, Ludovic Odoni, Jean-Luc Loubet
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Volume:
585
Year:
2005
Language:
english
Pages:
13
DOI:
10.1016/j.susc.2005.04.005
File:
PDF, 687 KB
english, 2005
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