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Hydrogen related point defects in silicon based layers: Si(·)H and SiOOH
Vladislav Dřínek, Karel Vacek, Gleb Yuzhakov, Zdeněk Bastl, Sergej NaumovVolume:
600
Year:
2006
Language:
english
Pages:
6
DOI:
10.1016/j.susc.2006.01.039
File:
PDF, 319 KB
english, 2006