Uncertainties in the determination of thermal emissivity by measurement of reflectance using Fourier transform spectrometers
P.A. van Nijnatten, M.G. Hutchins, N.B. Kilbey, A. Roos, K. Gelin, F. Geotti-Bianchini, P. Polato, C. Anderson, F. Olive, M. Köhl, R. Spragg, P. TurnerVolume:
502
Year:
2006
Language:
english
Pages:
6
DOI:
10.1016/j.tsf.2005.07.262
File:
PDF, 129 KB
english, 2006