Fullerene-incorporation for enhancing the electron beam resist performance for contact hole patterning and filling
Hsin-Chiang You, Fu-Hsiang Ko, Tan-Fu LeiVolume:
500
Year:
2006
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2005.11.040
File:
PDF, 253 KB
english, 2006