Raman scattering microcrystalline assessment and device...

Thin Solid Films 2008 Vol. 516; Iss. 20

Raman scattering microcrystalline assessment and device quality control of electrodeposited CuIn(S,Se)2 based solar cells

V. Izquierdo, A. Pérez-Rodríguez, L. Calvo-Barrio, J. Álvarez-García, J.R. Morante, V. Bermudez, O. Ramdani, J. Kurdi, P.P. Grand, L. Parissi, O. Kerrec
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Volume:
516
Year:
2008
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2007.12.068
File:
PDF, 612 KB
english, 2008
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