Aluminium incorporation in...

Thin Solid Films 2008 Vol. 516; Iss. 23

Aluminium incorporation in AlxGa1 − xN/GaN heterostructures: A comparative study by ion beam analysis and X-ray diffraction

A. Redondo-Cubero, R. Gago, F. González-Posada, U. Kreissig, M.-A. di Forte Poisson, A.F. Braña, E. Muñoz
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Volume:
516
Year:
2008
Language:
english
Pages:
6
DOI:
10.1016/j.tsf.2008.04.069
File:
PDF, 680 KB
english, 2008
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