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Grazing incidence X-ray study of Ge-nanoparticle formation in (Ge:SiO2)/SiO2 multilayers
K. Salamon, O. Milat, M. Buljan, U.V. Desnica, N. Radić, P. Dubček, S. BernstorffVolume:
517
Year:
2009
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2008.09.098
File:
PDF, 772 KB
english, 2009