Probing large area surface plasmon interference in thin metal films using photon scanning tunneling microscopy
A. Passian, A. Wig, A.L. Lereu, P.G. Evans, F. Meriaudeau, T. Thundat, T.L. FerrellVolume:
100
Year:
2004
Language:
english
Pages:
8
DOI:
10.1016/j.ultramic.2003.11.018
File:
PDF, 435 KB
english, 2004