Imaging Si nanoparticles embedded in SiO2 layers by (S)TEM-EELS
S. Schamm, C. Bonafos, H. Coffin, N. Cherkashin, M. Carrada, G. Ben Assayag, A. Claverie, M. Tencé, C. ColliexVolume:
108
Year:
2008
Language:
english
Pages:
12
DOI:
10.1016/j.ultramic.2007.05.008
File:
PDF, 2.02 MB
english, 2008