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Electron beam confinement and image contrast enhancement in near field emission scanning electron microscopy
T.L. Kirk, L.G. De Pietro, D. Pescia, U. RamspergerVolume:
109
Year:
2009
Language:
english
Pages:
4
DOI:
10.1016/j.ultramic.2008.11.009
File:
PDF, 357 KB
english, 2009