Sharing of secondary electrons by in-lens and out-lens...

Sharing of secondary electrons by in-lens and out-lens detector in low-voltage scanning electron microscope equipped with immersion lens

Kazuhiro Kumagai, Takashi Sekiguchi
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Volume:
109
Year:
2009
Language:
english
Pages:
5
DOI:
10.1016/j.ultramic.2009.01.005
File:
PDF, 370 KB
english, 2009
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