From thickness dependent exit waves to projected potential:...

From thickness dependent exit waves to projected potential: Thickness derivative approach

Qiang Xu, Dirk. Van Dyck, Henny W. Zandbergen
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Volume:
110
Year:
2010
Language:
english
Pages:
8
DOI:
10.1016/j.ultramic.2009.10.008
File:
PDF, 1.21 MB
english, 2010
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