Double aberration correction in a low-energy electron microscope
Th. Schmidt, H. Marchetto, P.L. Lévesque, U. Groh, F. Maier, D. Preikszas, P. Hartel, R. Spehr, G. Lilienkamp, W. Engel, R. Fink, E. Bauer, H. Rose, E. Umbach, H.-J. FreundVolume:
110
Year:
2010
Language:
english
Pages:
4
DOI:
10.1016/j.ultramic.2010.07.007
File:
PDF, 564 KB
english, 2010