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A Bayesian machine learning method for sensor selection and fusion with application to on-board fault diagnostics
Niranjan Subrahmanya, Yung C. Shin, Peter H. MecklVolume:
24
Year:
2010
Language:
english
Pages:
11
DOI:
10.1016/j.ymssp.2009.06.010
File:
PDF, 313 KB
english, 2010