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Measurement of toxic volatile organic compounds in indoor air of semiconductor foundries using multisorbent adsorption/thermal desorption coupled with gas chromatography–mass spectrometry
Chien-Hou Wu, Ming-Nan Lin, Chien-Tai Feng, Kuang-Ling Yang, Yu-Shiu Lo, Jiunn-GuangVolume:
996
Year:
2003
Language:
english
Pages:
7
DOI:
10.1016/s0021-9673(03)00544-2
File:
PDF, 278 KB
english, 2003