In situ spectroscopic ellipsometry of MOCVD-grown GaN...

In situ spectroscopic ellipsometry of MOCVD-grown GaN compounds for on-line composition determination and growth control

A. Bonanni, D. Stifter, A. Montaigne-Ramil, K. Schmidegg, K. Hingerl, H. Sitter
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
248
Year:
2003
Language:
english
Pages:
5
DOI:
10.1016/s0022-0248(02)01863-8
File:
PDF, 144 KB
english, 2003
Conversion to is in progress
Conversion to is failed