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Preparation and characterization of MOCVD bismuth telluride thin films
A. Boulouz, A. Giani, F. Pascal-Delannoy, M. Boulouz, A. Foucaran, A. BoyerVolume:
194
Year:
1998
Language:
english
Pages:
6
DOI:
10.1016/s0022-0248(98)00690-3
File:
PDF, 133 KB
english, 1998