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Overstress and electrostatic discharge in CMOS and BCD integrated circuits
G. Meneghesso, M. Ciappa, P. Malberti, L. Sponton, G. Croce, C. Contiero, E. ZanoniVolume:
40
Year:
2000
Language:
english
Pages:
8
DOI:
10.1016/s0026-2714(00)00190-6
File:
PDF, 761 KB
english, 2000