Reliability evaluation of a silicon-on-silicon MCM-D...

Microelectronics Reliability 2001 Vol. 41; Iss. 6

Reliability evaluation of a silicon-on-silicon MCM-D package

J Barton, G McCarthy, R Doyle, K Delaney, E Cabruja, M Lozano, A Collado, J Santander
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Volume:
41
Year:
2001
Language:
english
Pages:
13
DOI:
10.1016/s0026-2714(01)00014-2
File:
PDF, 2.05 MB
english, 2001
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