Substrate potential shift due to parasitic minority carrier injection in smart-power ICs: measurements and full-chip 3D device simulation
M Schenkel, P Pfäffli, W Wilkening, D Aemmer, W FichtnerVolume:
41
Year:
2001
Language:
english
Pages:
8
DOI:
10.1016/s0026-2714(01)00028-2
File:
PDF, 464 KB
english, 2001