Front Side and Backside OBIT Mappings applied to Single...

Front Side and Backside OBIT Mappings applied to Single Event Transient Testing

D. Lewis, V. Pouget, T. Beauchêne, H. Lapuyade, P. Fouillat, A. Touboul, F. Beaudoin, P. Perdu
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Volume:
41
Year:
2001
Pages:
6
DOI:
10.1016/s0026-2714(01)00198-6
File:
PDF, 551 KB
2001
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