Front Side and Backside OBIT Mappings applied to Single Event Transient Testing
D. Lewis, V. Pouget, T. Beauchêne, H. Lapuyade, P. Fouillat, A. Touboul, F. Beaudoin, P. PerduVolume:
41
Year:
2001
Pages:
6
DOI:
10.1016/s0026-2714(01)00198-6
File:
PDF, 551 KB
2001