Analysis and modeling of a digital CMOS circuit operation and reliability after gate oxide breakdown: a case study
B. Kaczer, R. Degraeve, M. Rasras, A. De Keersgieter, K. Van de Mieroop, G. GroesenekenVolume:
42
Year:
2002
Language:
english
Pages:
10
DOI:
10.1016/s0026-2714(02)00026-4
File:
PDF, 346 KB
english, 2002