Origin of hot carrier degradation in advanced nMOSFET...

Origin of hot carrier degradation in advanced nMOSFET devices

B. Cretu, F. Balestra, Ghibaudo, G. Guégan*
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Volume:
42
Year:
2002
Pages:
4
DOI:
10.1016/s0026-2714(02)00159-2
File:
PDF, 602 KB
2002
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