Optical diagnosis of excess IDDQ in low power CMOS circuits

Microelectronics Reliability 2002 Vol. 42; Iss. 9-11

Optical diagnosis of excess IDDQ in low power CMOS circuits

Franco Stellari, Peilin Song, James C. Tsang, Moyra K. McManus, Mark B. Ketchen
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Volume:
42
Year:
2002
Pages:
6
DOI:
10.1016/s0026-2714(02)00213-5
File:
PDF, 1.35 MB
2002
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