New insights into the change of voltage acceleration and...

Microelectronics Reliability 2003 Vol. 43; Iss. 8

New insights into the change of voltage acceleration and temperature activation of oxide breakdown

G. Ribes, S. Bruyère, F. Monsieur, D. Roy, V. Huard
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Volume:
43
Year:
2003
Language:
english
Pages:
4
DOI:
10.1016/s0026-2714(03)00174-4
File:
PDF, 95 KB
english, 2003
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