A dual-beam Michelson interferometer for investigation of...

Microelectronics Reliability 2003 Vol. 43; Iss. 9-11

A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stress

V. Dubec, S. Bychikhin, M. Blaho, D. Pogany, E. Gornik, J. Willemen, N. Qu, W. Wilkening, L. Zullino, A. Andreini
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
43
Year:
2003
Pages:
5
DOI:
10.1016/s0026-2714(03)00274-9
File:
PDF, 1.09 MB
2003
Conversion to is in progress
Conversion to is failed