Short defect characterization based on TCR parameter extraction
A. Firiti, D. Faujour, G. Haller, J.M. Moragues, V. Goubier, P. Perdu, F. Beaudoin, D. LewisVolume:
43
Year:
2003
Pages:
6
DOI:
10.1016/s0026-2714(03)00275-0
File:
PDF, 1.60 MB
2003