Surface leakage current related failure of power silicon...

Surface leakage current related failure of power silicon devices operated at high junction temperature

K.I. Nuttall, O. Buiu, V.V.N. Obreja
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
43
Year:
2003
Pages:
6
DOI:
10.1016/s0026-2714(03)00325-1
File:
PDF, 848 KB
2003
Conversion to is in progress
Conversion to is failed