Applications of scanning electrical force microscopy

Applications of scanning electrical force microscopy

F. Müller, A.-D. Müller, M. Hietschold, S. Kämmer
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Volume:
37
Year:
1997
Language:
english
Pages:
4
DOI:
10.1016/s0026-2714(97)00127-3
File:
PDF, 242 KB
english, 1997
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