On the extraction of the source and drain series...

Microelectronics Reliability 1999 Vol. 39; Iss. 8

On the extraction of the source and drain series resistances of MOSFETs

F.J. Garcı́a Sánchez, A. Ortiz-Conde, J.J. Liou
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Volume:
39
Year:
1999
Language:
english
Pages:
12
DOI:
10.1016/s0026-2714(99)00028-1
File:
PDF, 230 KB
english, 1999
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